JPH0361998B2 - - Google Patents

Info

Publication number
JPH0361998B2
JPH0361998B2 JP60218304A JP21830485A JPH0361998B2 JP H0361998 B2 JPH0361998 B2 JP H0361998B2 JP 60218304 A JP60218304 A JP 60218304A JP 21830485 A JP21830485 A JP 21830485A JP H0361998 B2 JPH0361998 B2 JP H0361998B2
Authority
JP
Japan
Prior art keywords
floating plate
pressed
socket
cover plate
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60218304A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6276274A (ja
Inventor
Ryoji Maruyama
Kazuyoshi Odaka
Kenichi Taya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP60218304A priority Critical patent/JPS6276274A/ja
Publication of JPS6276274A publication Critical patent/JPS6276274A/ja
Publication of JPH0361998B2 publication Critical patent/JPH0361998B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)
JP60218304A 1985-09-30 1985-09-30 Ｉｃソケツト Granted JPS6276274A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60218304A JPS6276274A (ja) 1985-09-30 1985-09-30 Ｉｃソケツト

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60218304A JPS6276274A (ja) 1985-09-30 1985-09-30 Ｉｃソケツト

Publications (2)

Publication Number Publication Date
JPS6276274A JPS6276274A (ja) 1987-04-08
JPH0361998B2 true JPH0361998B2 (en]) 1991-09-24

Family

ID=16717738

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60218304A Granted JPS6276274A (ja) 1985-09-30 1985-09-30 Ｉｃソケツト

Country Status (1)

Country Link
JP (1) JPS6276274A (en])

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0526543Y2 (en]) * 1987-04-27 1993-07-05
JPS63291375A (ja) * 1987-05-22 1988-11-29 Yamaichi Electric Mfg Co Ltd Ｉｃソケット
JPH01119043A (ja) * 1987-10-31 1989-05-11 Yamaichi Electric Mfg Co Ltd Ｉｃソケット
JPH05209933A (ja) * 1992-01-29 1993-08-20 Nec Corp 被測定物位置出し機構付きコンタクタおよびそれを用いた自動選別装置
US5247250A (en) * 1992-03-27 1993-09-21 Minnesota Mining And Manufacturing Company Integrated circuit test socket
US5791914A (en) * 1995-11-21 1998-08-11 Loranger International Corporation Electrical socket with floating guide plate
US5647756A (en) * 1995-12-19 1997-07-15 Minnesota Mining And Manufacturing Integrated circuit test socket having toggle clamp lid
US5788526A (en) * 1996-07-17 1998-08-04 Minnesota Mining And Manufacturing Company Integrated circuit test socket having compliant lid and mechanical advantage latch
JP2002270321A (ja) * 2001-03-07 2002-09-20 Advanex Inc 半導体パッケージ用ソケット

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4921417U (en]) * 1972-05-26 1974-02-23
JPS5830295U (ja) * 1981-08-24 1983-02-26 山一電機工業株式会社 集積回路板用ソケツト
JPS59218762A (ja) * 1983-05-26 1984-12-10 Fujitsu Ltd リ−ドレスチツプキヤリアの実装方法

Also Published As

Publication number Publication date
JPS6276274A (ja) 1987-04-08

Similar Documents

Publication Publication Date Title
JP4301669B2 (ja) ソケット
CN110031748A (zh) 集成电路元件测试装置及测试方法
JPH0361998B2 (en])
JPH0361997B2 (en])
KR950033507A (ko) Ic 측정시험장치 및 이것을 사용한 ic 측정시험방법
CN218956647U (zh) 一种便于芯片压合的旋盖式芯片测试座
US6544044B2 (en) Socket for BGA package
KR100496634B1 (ko) 테스트 소켓
CN223217532U (zh) 一种高适配性的芯片测试座
US5831443A (en) Probe card array check plate with transition zones
JPH0515431U (ja) Ｉｃ試験装置のテストヘツドと試料との接続機構
JPH0310274U (en])
US20020074640A1 (en) Semiconductor test socket having pogo-pin contacts
CN215953664U (zh) 一种兼容不同pin数金手指测试的夹子治具
JPH0310273U (en])
JP2555716Y2 (ja) テストヘッド
JPH0441342Y2 (en])
JP2549936Y2 (ja) 電子部品検査器における電子部品装着具
JPH0363935U (en])
JP2544984Y2 (ja) 半導体素子特性検査用治具
US6079989A (en) Electrical connection device having electrical connection members with a tubular body and a sliding tip
USH663H (en) High density probe head for chip testing
JPH09134767A (ja) 評価用ｌｓｉソケット
JPH01121866U (en])
JPS6124244A (ja) 半導体装置のテスタ用固定カ−ド

Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees